X-Ray Diffractometers Surface Analyzers - Image 1

X-Ray Diffractometers Surface Analyzers

X-ray Fluorescence Spectrometers
Surface Analyzers

These X-ray diffractometers are equipped with the OneSight wide-range and highspeed detector, which makes possible high-speed and high-sensitivity measurements.

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Description

X-Ray Diffractometer with Wide-Range and High-Speed Detector
XRD-6100 OneSight/7000S OneSight/7000L OneSight

These X-ray diffractometers are equipped with the OneSight wide-range and highspeed detector, which makes possible high-speed and high-sensitivity measurements. The measurement window of the software has also been completely revised, so operability is greatly enhanced. A door lock mechanism is activated whenever X-rays are emitted, thus contributing toward the enhanced safety of the unit. The system can accommodate a broad variety of applications, ranging from fundamental ones, such as qualitative and quantitative analyses, to applications such as crystalline structure analysis, which can be accomplished using optional software. The XRD6100 OneSight is a compact and simplified model, which is equipped with a vertical type, high-precision goniometer. The XRD-7000S OneSight and 7000L OneSight are equipped with a horizontal-sample-type goniometer, which allows extremely large samples to be accommodated.

 

Wide-Range and High-Speed Detector for XRD-6100/7000
OneSight™

This is an optional detector that can be installed in an existing XRD-6100/7000. This is a wide-range detector comprising 1,280 channels of semiconductor elements. An intensity that is more than 100 times greater than existing scintillation detectors can be achieved, thus allowing high-speed measurement. Moreover, by taking advantage of the wide-range angle measurement, the unit can offer the “One-Shot Mode,” which performs analysis while the goniometer is in a fixed position. Ease-ofuse has also been improved using the software that provides for measurements with OneSight.

 

 

Electron Probe Microanalyzer
EPMA-8050G

Debut of the Grand EPMA

Shimadzu’s FE-EPMA system features a cutting-edge FE electron optical system that provides the ultimate in advanced analytical resolution. This provides unprecedented spatial resolution for SEM observation with beam current higher than 3 µA. In combination with Shimadzu’s traditionally high performance X-ray spectrometers, this advanced FE electron optical system can provide both maximum resolution and maximum sensitivity at the same time.

 

 

Features

  • Includes cutting-edge FE electron optical system
  • Up to five high-sensitivity 4-inch spectrometers can be included.
  • Includes 4-interval high-sensitivity BSE detector
  • Windows-compatible operating system
  • Intelligent vacuum evacuation system
  • Includes easy mode analysis function for the automation system
  • Dual stigmator included standard


Ultra High Resolution Mapping
The beam can be emitted at a maximum current over 3 µA.

Mapping Analysis of Trace Elements in Stainless Steel
Left: Clearly shows distribution of phases with slightly differing concentrations of Cr.
Right: Distribution of Mn concentrations less than 0.1 % are visible.