X-ray and Surface Analysis Systems | Asterix United (B) Sdn Bhd

Analytical, X-ray and Surface Analysis Systems
Surface Analyzers

The Electron Probe Microanalyzer (EPMA) allows highly sensitive analysis of elements in micron-scale regions on the sample.

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Analytical, X-ray and Surface Analysis Systems
Surface Observation Instruments

The HR-SPM ™ is a next-generation scanning probe microscope that employs a frequency detection method. Existing SPMs (scanning probe microscopes) and AFMs (atomic force microscopes) generally employ an AM (amplitude…

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Analytical, X-ray and Surface Analysis Systems
X-Ray Diffractometers Surface Analyzers

These X-ray diffractometers are equipped with the OneSight wide-range and highspeed detector, which makes possible high-speed and high-sensitivity measurements.

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Analytical, X-ray and Surface Analysis Systems
X-ray Fluorescence Spectrometers

Equipped with an electronically cooled high-performance semiconductor detector, the EDX-7000/8000 is designed for reduced running costs and ease of maintenance while providing better sensitivity, throughput, and resolution than conventional models.

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