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Surface Observation Instruments

Surface Analyzers
TOC Analyzers

The HR-SPM ™ is a next-generation scanning probe microscope that employs a frequency detection method. Existing SPMs (scanning probe microscopes) and AFMs (atomic force microscopes) generally employ an AM (amplitude modulation) method. In principle however, the FM (frequency modulation) method is a high-sensitivity measurement method, which enables imaging at even higher levels of resolution.

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Description

High-Resolution Scanning Probe Microscope
SPM-8100FM

The HR-SPM ™ is a next-generation scanning probe microscope that employs a frequency detection method. Existing SPMs (scanning probe microscopes) and AFMs (atomic force microscopes) generally employ an AM (amplitude modulation) method. In principle however, the FM (frequency modulation) method is a high-sensitivity measurement method, which enables imaging at even higher levels of resolution. Not only does it enable ultra-high-resolution observation of atmospheric or liquid-based targets, but now, for the first time, observation of hydration/solvation of the solid-liquid interface is made possible.

Features of the HR-SPM

  • Uses the FM method
  • Noise in air and liquids is reduced to 1/20 that of existing methods.
  • Achieves the performance level of a vacuum-type SPM, even in air and liquids.
  • Enables measurement of the local structure at the solid-liquid interface.
  • HT scanner extends observation area and shortens observation times.
  • Dual monitors and signal indication function provide significant improvement in flexibility.

 

Differences Compared with Existing SPM/AFM

 

 

 

Scanning Probe Microscope
SPM-9700HT

This microscope can observe the three-dimensional image or local properties of samples at high magnifications. It enables high-resolution observation, and can measure a variety of samples in air and in liquids. Due to the newly developed high response speed HT scanner and the optimized control system design and software, it is now possible to acquire image data at more than five times the speed of Shimadzu’s previous models. This supports the improvement of total throughput via significant reductions in measurement time. The system is ideal for measurements involving a large number of samples or for routine observations.

 

 

Environment-Control Scanning
Probe Microscope
WET-SPM Series

Permits SPM observations in a controlled environment. The environment-controlled chamber with a large viewport and twin gloves permits all types of pretreatment in a fully controlled environment. It offers in-situ SPM observations of changes to a sample due to fluctuations in factors such as temperature, humidity, pressure, light quantity, and concentration. (Japan and US Patented)